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P. 266
Chapter 9
· More extensive use of techniques to analyse the CIGS solar cells physical
properties after degradation, like admittance spectroscopy, deep level
transient spectroscopy (DLTS) and CV and IV(T) measurements
· More extensive use of techniques to analyse chemical changes in composition
of the solar cell, like XPS, SIMS and XRD
· Round-robins between testing institutes to investigate whether differences in
stability are caused by difference in samples or in testing methods.
264
· More extensive use of techniques to analyse the CIGS solar cells physical
properties after degradation, like admittance spectroscopy, deep level
transient spectroscopy (DLTS) and CV and IV(T) measurements
· More extensive use of techniques to analyse chemical changes in composition
of the solar cell, like XPS, SIMS and XRD
· Round-robins between testing institutes to investigate whether differences in
stability are caused by difference in samples or in testing methods.
264
