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Appendix A
Appendix A: Analysis techniques
All samples in this thesis have been extensively characterised before, after and in
some case during degradation. The used analysis techniques have been summarised
in Table A.1.
Table A.1 Analysis techniques and their abbreviations as used in this thesis.
Analysis technique Abbreviation Measured characteristics
Four-point probe Resistivity and sheet resistance
Spectrophotometry UV-VIS-NIR Transmission, reflection and absorption
Light microscopy Visual and optical characteristics
Scanning Electron Microscopy-Ele - SEM-EDX Morphological, compositional and structural
mental Dispersive X-ray spectroscopy properties
X-Ray Diffraction XRD Structural and compositional parameters
Raman spectroscopy Surface composition
(Time-of-Flight) Secondary Ion Mass (ToF)-SIMS Compositional depth profiling
Spectrometry
X-ray photoelectron spectroscopy XPS Surface composition
Hall effect Resistivity, electron mobility and carrier
concentration
Dektak profilometer Thickness and macroscopic roughness
Helium Ion Microscopy HIM Structural properties
Current-voltage measurements IV External parameters of the solar cell
External Quantum Efficiency / Spec - EQE / SR Wavelength dependent light absorption
tral Response
Lock-In Thermography LIT Spatial defects
Inductively Coupled Plasma – Mass ICP-MS Metal content in water
Spectrometry
Temperature dependent current- IV(T) External parameters of the solar cell at low
voltage measurements temperature
More information about these techniques as used for thin film solar cells can be found
in reference [1].
References
[1] D. Abou-Ras, T. Kirchartz U., Rau, Advanced
Characterisation Techniques for Thin Film So-
lar Cells, Wiley-VCH Verlag GmbH & Co. KGa
AWeinheim (2011)
282
Appendix A: Analysis techniques
All samples in this thesis have been extensively characterised before, after and in
some case during degradation. The used analysis techniques have been summarised
in Table A.1.
Table A.1 Analysis techniques and their abbreviations as used in this thesis.
Analysis technique Abbreviation Measured characteristics
Four-point probe Resistivity and sheet resistance
Spectrophotometry UV-VIS-NIR Transmission, reflection and absorption
Light microscopy Visual and optical characteristics
Scanning Electron Microscopy-Ele - SEM-EDX Morphological, compositional and structural
mental Dispersive X-ray spectroscopy properties
X-Ray Diffraction XRD Structural and compositional parameters
Raman spectroscopy Surface composition
(Time-of-Flight) Secondary Ion Mass (ToF)-SIMS Compositional depth profiling
Spectrometry
X-ray photoelectron spectroscopy XPS Surface composition
Hall effect Resistivity, electron mobility and carrier
concentration
Dektak profilometer Thickness and macroscopic roughness
Helium Ion Microscopy HIM Structural properties
Current-voltage measurements IV External parameters of the solar cell
External Quantum Efficiency / Spec - EQE / SR Wavelength dependent light absorption
tral Response
Lock-In Thermography LIT Spatial defects
Inductively Coupled Plasma – Mass ICP-MS Metal content in water
Spectrometry
Temperature dependent current- IV(T) External parameters of the solar cell at low
voltage measurements temperature
More information about these techniques as used for thin film solar cells can be found
in reference [1].
References
[1] D. Abou-Ras, T. Kirchartz U., Rau, Advanced
Characterisation Techniques for Thin Film So-
lar Cells, Wiley-VCH Verlag GmbH & Co. KGa
AWeinheim (2011)
282
